Scan Fit & Measure Version 5: What’s New in the Latest Major Release
The latest major release of Scan Fit & Measure introduces a new generation of measurement capabilities designed to make profile inspection faster, easier, more reliable and more intelligent.
Version 5 combines enhanced CAD and reverse engineering functionality with new AI-powered tools, simplified measurement workflows, improved standards support and significant enhancements to the Measurement Data Center (MDC).
The result is a more automated and efficient workflow that helps operators move from scanning and profile preparation to measurement, evaluation, reporting and archiving with less manual effort.
Key Highlights
- Enhanced CAD import and automated contour extraction
- AI Chips & Burrs Removal and a new AI Smart Assistant
- Improved reverse engineering, Automatic Mirror & Fit and new measurement tools
- Integrated ANSI H35.2 tolerances and expanded Measurement Data Center capabilities
Together, these updates reduce repetitive manual work and simplify the way operators prepare, measure and evaluate scanned profiles.
Enhanced CAD Import
CAD drawings containing multiple contours can now be imported more easily.
Instead of selecting each contour individually, the operator can draw a rectangular selection around the required area. All relevant contours inside the selected area are then included automatically.
This is particularly useful for drawings with multiple contours, complex geometries or assemblies. It reduces the need to select contours one by one and helps shorten CAD preparation time before measurement begins.
Automated Contour Extraction
Contour extraction has been improved with automated parameter recognition.
Scan Fit & Measure can automatically determine the appropriate parameters for contour extraction, reducing the amount of manual adjustment required from the operator.
This makes profile preparation faster and more consistent while also simplifying the workflow for less experienced users.
AI Chips & Burrs Removal
Version 5 introduces new AI algorithms that automatically recognize chips, burrs and profile dust on the profile contour and remove them before measurement.
This is especially useful when measuring profiles directly from production, where small imperfections can affect contour extraction and measurement results.
By automatically removing unwanted elements, the functionality can reduce profile preparation time, improve contour quality and minimize the amount of manual cleaning required before measurement. Operators can therefore move from scanning to measurement faster and with less manual intervention.
AI Smart Assistant
A new AI Smart Assistant is now integrated directly into Scan Fit & Measure.
Operators can ask questions in their own language, and the assistant provides answers in the same language. Because the assistant is available directly inside the measurement software, users do not need to leave the application to search for information.
The AI Smart Assistant can help operators understand software functions, access assistance more quickly and reduce dependence on external manuals and documentation. It can also support the onboarding of new operators by making relevant information easier to access during everyday work.
Improved Reverse Engineering
The reverse engineering workflow has been enhanced to make the creation of usable geometry from scanned profiles faster and more automated.
Improvements to contour recognition and geometry processing simplify the transition from a scanned profile to usable CAD geometry.
The updated workflow reduces the need for manual geometry correction and makes it easier to prepare scanned profile geometry for further engineering work.
Automatic Mirror & Fit
Scan Fit & Measure can now automatically mirror the scanned profile when required and fit it to the CAD drawing.
This removes manual mirroring and alignment steps that previously had to be performed by the operator.
The functionality provides automatic orientation correction, faster CAD-to-profile alignment and a simpler measurement setup with less operator intervention.
New Diameter & Radius Tools
New Diameter and Radius measurement tools make these measurements easier to access and use.
The enhanced functionality simplifies the measurement of circular and radial geometry and provides a more intuitive workflow when operators need to inspect these features.
Smart Hollow Width
Measuring hollow widths now requires fewer steps.
The operator no longer needs to construct measurement points manually. Instead, the user can select the two sides of the hollow, and Scan Fit & Measure calculates the distance automatically.
This makes hollow measurements faster, reduces operator interaction and simplifies the inspection of more complex hollow profiles.
Integrated ANSI H35.2 Aluminium Extrusion Tolerances
Version 5 integrates ANSI H35.2 requirements for aluminium extrusion tolerances directly into the measurement workflow.
This allows users to work with standardized aluminium extrusion tolerances without relying only on separate external tolerance tables.
The integration can make tolerance evaluation faster and simplify the verification of aluminium extrusion profiles during quality inspection.
New Measurement Data Center Capabilities
The latest release also introduces important enhancements to the Measurement Data Center (MDC).
MDC provides centralized access to measurement results, reporting and quality data. Version 5 expands the ways users can evaluate, verify and archive their measurements.
New Thermometer Evaluation
A new thermometer-style evaluation provides a clear visual representation of measurement results relative to their tolerances.
This helps operators and quality engineers identify deviations and understand measurement status more quickly.
Remeasurement with Manual Instruments
Measured values can now be remeasured and compared using manual measuring instruments.
This provides an additional verification option when users need to compare scanner-based measurements with results obtained using traditional measurement tools.
Improved Archiving
Measurement files can now be archived together with the relevant profile images.
This provides a more complete record of the inspection and makes historical measurement data easier to review later.
Together, the New MDC Capabilities Support:
- Clearer visualization of measurement results
- Additional verification with manual instruments
- More complete archived measurement records
- Improved traceability and review of historical measurements
These improvements make MDC more useful for both day-to-day result evaluation and long-term quality documentation.
New Area Dimension / Record
A new Area Dimension / Record has been added to the measurement functionality.
Scan Fit & Measure can calculate and record the area of the measured profile, providing additional information for profile analysis and quality control.
For example, profile area data can be useful where cross-sectional area is related to material consumption, weight calculations or other production parameters.
Filtering Green and Red Dimensions in the Single Report Drawing
Version 5 also introduces filtering of green and red dimensions in the single report drawing.
This gives users another way to review reported dimensions according to their displayed measurement status and focus on the results that are most relevant during evaluation.
A New Generation of Profile Measurement
Version 5 brings improvements across several stages of the Scan Fit & Measure workflow, from CAD preparation and contour extraction to measurement, reverse engineering and result evaluation.
The main direction of the release is clear:
- Reduce repetitive manual work
- Make profile preparation and measurement easier
- Introduce more automation and AI-assisted functionality
- Expand measurement evaluation and quality-control capabilities
With these updates, Scan Fit & Measure Version 5 gives operators more tools to move efficiently from scanning and measurement to evaluation, reporting and archiving.
The new release is designed to make profile inspection more intuitive, automated and efficient while providing additional capabilities for quality control, verification and long-term measurement data management.